JPH0211012B2 - - Google Patents
Info
- Publication number
- JPH0211012B2 JPH0211012B2 JP58150978A JP15097883A JPH0211012B2 JP H0211012 B2 JPH0211012 B2 JP H0211012B2 JP 58150978 A JP58150978 A JP 58150978A JP 15097883 A JP15097883 A JP 15097883A JP H0211012 B2 JPH0211012 B2 JP H0211012B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- reaction tube
- substrate
- metal
- quartz
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000010408 film Substances 0.000 claims description 49
- 238000006243 chemical reaction Methods 0.000 claims description 28
- 239000000758 substrate Substances 0.000 claims description 20
- 239000010453 quartz Substances 0.000 claims description 17
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 17
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000002184 metal Substances 0.000 claims description 15
- 150000002736 metal compounds Chemical class 0.000 claims description 14
- 239000010409 thin film Substances 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 13
- 239000010703 silicon Substances 0.000 claims description 13
- 229910052710 silicon Inorganic materials 0.000 claims description 13
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 12
- 238000001947 vapour-phase growth Methods 0.000 claims description 11
- 238000000151 deposition Methods 0.000 claims 1
- 239000007789 gas Substances 0.000 description 9
- 230000007547 defect Effects 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 239000012808 vapor phase Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- NXHILIPIEUBEPD-UHFFFAOYSA-H tungsten hexafluoride Chemical compound F[W](F)(F)(F)(F)F NXHILIPIEUBEPD-UHFFFAOYSA-H 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/34—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions
- C03C17/36—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal
- C03C17/3602—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal the metal being present as a layer
- C03C17/3607—Coatings of the type glass/inorganic compound/metal
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/34—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions
- C03C17/36—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/34—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions
- C03C17/36—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal
- C03C17/3602—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal the metal being present as a layer
- C03C17/3636—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal the metal being present as a layer one layer at least containing silicon, hydrogenated silicon or a silicide
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/34—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions
- C03C17/36—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal
- C03C17/3602—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal the metal being present as a layer
- C03C17/3649—Surface treatment of glass, not in the form of fibres or filaments, by coating with at least two coatings having different compositions at least one coating being a metal the metal being present as a layer made of metals other than silver
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/02—Pretreatment of the material to be coated
- C23C16/0272—Deposition of sub-layers, e.g. to promote the adhesion of the main coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4404—Coatings or surface treatment on the inside of the reaction chamber or on parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58150978A JPS6042823A (ja) | 1983-08-19 | 1983-08-19 | 薄膜形成方法 |
DE8484304479T DE3461302D1 (en) | 1983-08-19 | 1984-06-29 | Method of forming thin film |
EP84304479A EP0134645B1 (en) | 1983-08-19 | 1984-06-29 | Method of forming thin film |
US06/780,242 US4650698A (en) | 1983-08-19 | 1985-09-26 | Method of forming a thin film of a metal or metal compound on a substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58150978A JPS6042823A (ja) | 1983-08-19 | 1983-08-19 | 薄膜形成方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6042823A JPS6042823A (ja) | 1985-03-07 |
JPH0211012B2 true JPH0211012B2 (en]) | 1990-03-12 |
Family
ID=15508605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58150978A Granted JPS6042823A (ja) | 1983-08-19 | 1983-08-19 | 薄膜形成方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4650698A (en]) |
EP (1) | EP0134645B1 (en]) |
JP (1) | JPS6042823A (en]) |
DE (1) | DE3461302D1 (en]) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03126820U (en]) * | 1990-04-02 | 1991-12-20 | ||
JPH047410U (en]) * | 1990-04-27 | 1992-01-23 | ||
JPH04109085U (ja) * | 1990-09-04 | 1992-09-21 | 株式会社池口工業 | 物品包装容器 |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4741928A (en) * | 1985-12-27 | 1988-05-03 | General Electric Company | Method for selective deposition of tungsten by chemical vapor deposition onto metal and semiconductor surfaces |
DE3709066A1 (de) * | 1986-03-31 | 1987-10-01 | Toshiba Kawasaki Kk | Verfahren zum erzeugen eines duennen metallfilms durch chemisches aufdampfen |
US4732801A (en) * | 1986-04-30 | 1988-03-22 | International Business Machines Corporation | Graded oxide/nitride via structure and method of fabrication therefor |
DE3751755T2 (de) * | 1986-06-30 | 1997-04-03 | Nihon Sinku Gijutsu K K | Verfahren und Vorrichtung zum Abscheiden aus der Gasphase |
EP0252667B1 (en) * | 1986-06-30 | 1996-03-27 | Nihon Sinku Gijutsu Kabushiki Kaisha | Chemical vapour deposition methods |
US4800105A (en) * | 1986-07-22 | 1989-01-24 | Nihon Shinku Gijutsu Kabushiki Kaisha | Method of forming a thin film by chemical vapor deposition |
GB2195663B (en) * | 1986-08-15 | 1990-08-22 | Nippon Telegraph & Telephone | Chemical vapour deposition method and apparatus therefor |
US5169680A (en) * | 1987-05-07 | 1992-12-08 | Intel Corporation | Electroless deposition for IC fabrication |
US4749597A (en) * | 1987-10-19 | 1988-06-07 | Spectrum Cvd, Inc. | Process for CVD of tungsten |
US5342652A (en) * | 1992-06-15 | 1994-08-30 | Materials Research Corporation | Method of nucleating tungsten on titanium nitride by CVD without silane |
EP0595054A1 (en) * | 1992-10-30 | 1994-05-04 | Applied Materials, Inc. | Method for processing semiconductor wafers at temperatures exceeding 400 degrees C. |
JPH07176484A (ja) * | 1993-06-28 | 1995-07-14 | Applied Materials Inc | 窒化アルミニューム面を有するサセプタをサセプタの浄化後珪化タングステンで処理することによって半導体ウエハ上に珪化タングステンを一様に堆積する方法 |
US6090706A (en) * | 1993-06-28 | 2000-07-18 | Applied Materials, Inc. | Preconditioning process for treating deposition chamber prior to deposition of tungsten silicide coating on active substrates therein |
US5482749A (en) * | 1993-06-28 | 1996-01-09 | Applied Materials, Inc. | Pretreatment process for treating aluminum-bearing surfaces of deposition chamber prior to deposition of tungsten silicide coating on substrate therein |
JPH07172809A (ja) * | 1993-10-14 | 1995-07-11 | Applied Materials Inc | 基板上への珪化タングステンコーティングの堆積操作の事前に堆積チャンバのアルミニウムを有する表面を処理する予備処理プロセス |
JP3744554B2 (ja) * | 1994-09-09 | 2006-02-15 | キヤノンアネルバ株式会社 | 薄膜形成方法 |
JP3070660B2 (ja) * | 1996-06-03 | 2000-07-31 | 日本電気株式会社 | 気体不純物の捕獲方法及び半導体製造装置 |
US5824365A (en) * | 1996-06-24 | 1998-10-20 | Micron Technology, Inc. | Method of inhibiting deposition of material on an internal wall of a chemical vapor deposition reactor |
US6022587A (en) * | 1997-05-13 | 2000-02-08 | Applied Materials, Inc. | Method and apparatus for improving film deposition uniformity on a substrate |
US5795824A (en) * | 1997-08-28 | 1998-08-18 | Novellus Systems, Inc. | Method for nucleation of CVD tungsten films |
US6071573A (en) * | 1997-12-30 | 2000-06-06 | Lam Research Corporation | Process for precoating plasma CVD reactors |
US6019839A (en) * | 1998-04-17 | 2000-02-01 | Applied Materials, Inc. | Method and apparatus for forming an epitaxial titanium silicide film by low pressure chemical vapor deposition |
US6638819B1 (en) * | 2000-11-17 | 2003-10-28 | Newport Fab, Llc | Method for fabricating interfacial oxide in a transistor and related structure |
US7282183B2 (en) * | 2001-12-24 | 2007-10-16 | Agilent Technologies, Inc. | Atmospheric control in reaction chambers |
DE102004038717A1 (de) * | 2004-08-10 | 2006-02-23 | Joint Solar Silicon Gmbh & Co. Kg | Herstellungsverfahren für Reaktor zur Zersetzung von Gasen |
GB0512253D0 (en) * | 2005-06-16 | 2005-07-27 | Pilkington Plc | Coated glass pane |
DE102012106518A1 (de) * | 2012-07-18 | 2014-01-23 | H2 Solar Gmbh | Beschichtung von Substraten mit Siliciden und deren Oxide |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2884894A (en) * | 1956-11-02 | 1959-05-05 | Metallgesellschaft Ag | Apparatus for producing hard coatings on workpieces |
DE1086510B (de) * | 1957-05-11 | 1960-08-04 | Bosch Gmbh Robert | Verfahren zur Herstellung von Metallueberzuegen durch Vakuumbedampfen |
US3115957A (en) * | 1959-02-18 | 1963-12-31 | Eitel Mccullough Inc | Art of sealing quartz to metal |
US4100330A (en) * | 1977-03-28 | 1978-07-11 | Ppg Industries, Inc. | Method for coating glass with silicon and a metal oxide and resulting product |
JPS53141318A (en) * | 1977-05-17 | 1978-12-09 | Nippon Sheet Glass Co Ltd | Heat radiation reflecive glass |
US4180596A (en) * | 1977-06-30 | 1979-12-25 | International Business Machines Corporation | Method for providing a metal silicide layer on a substrate |
US4391846A (en) * | 1979-04-05 | 1983-07-05 | The United States Of America As Represented By The United States Department Of Energy | Method of preparing high-temperature-stable thin-film resistors |
JPS56155589A (en) * | 1980-05-06 | 1981-12-01 | Nippon Electric Co | Metallizing method |
JPS5776833A (en) * | 1980-09-04 | 1982-05-14 | Applied Materials Inc | Heat resistant metal depositing method and product thereof |
US4359490A (en) * | 1981-07-13 | 1982-11-16 | Fairchild Camera & Instrument Corp. | Method for LPCVD co-deposition of metal and silicon to form metal silicide |
DE3141567C2 (de) * | 1981-10-20 | 1986-02-06 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum Herstellen von aus Tantal, Wolfram oder Molybdän bestehenden Schichten bei niedrigen Temperaturen und Verwendung dieser Schichten |
-
1983
- 1983-08-19 JP JP58150978A patent/JPS6042823A/ja active Granted
-
1984
- 1984-06-29 EP EP84304479A patent/EP0134645B1/en not_active Expired
- 1984-06-29 DE DE8484304479T patent/DE3461302D1/de not_active Expired
-
1985
- 1985-09-26 US US06/780,242 patent/US4650698A/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03126820U (en]) * | 1990-04-02 | 1991-12-20 | ||
JPH047410U (en]) * | 1990-04-27 | 1992-01-23 | ||
JPH04109085U (ja) * | 1990-09-04 | 1992-09-21 | 株式会社池口工業 | 物品包装容器 |
Also Published As
Publication number | Publication date |
---|---|
EP0134645B1 (en) | 1986-11-12 |
US4650698A (en) | 1987-03-17 |
JPS6042823A (ja) | 1985-03-07 |
DE3461302D1 (en) | 1987-01-02 |
EP0134645A1 (en) | 1985-03-20 |
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